Zeiss Crossbeam FIB-SEM

Why Use This Microscope?

The Zeiss FIB-SEM permits three-dimensional reconstruction of entire cell volumes with sufficient spatial resolution to observe the fine details of organelles.

Imaging Modalities:

• Volumetric SEM
• Conventional SEM
• Cryo-SEM
• Preparation of Cryo-lamella for downstream Cryo-ET

Configurations:

FIB-SEM: 

• The gallium FIB column supports ion beam voltages from 500 eV – 30 keV with a resolution of less than 3 nm at 30 keV and beam currents up to 100 nA.
• The SEM column features a field emission Schottky emitter and a double condenser system optimized for best possible resolution at low voltage, ideal for resolving surface details in biological systems.

Detectors: 

• Everhart-Thornley secondary electron detector that is used to image the surface details of all samples and in alignment of the sample for milling operations.
• In-lens secondary detector used for simultaneous ion-milling and electron imaging.
• In-lens backscatter detector (EsB) optimized for low energy backscatter detection and able to capture surface backscattered electrons down to 1.5 keV, allowing blockface imaging with minimal interaction volumes. The EsB detector may also be used in conjunction with the Leica Cryo-Stage to perform volumetric imaging on rapidly frozen samples.

Software:

• Atlas 5: Software for automated imaging. The automated processes allows maximum usage of the instrument, extending for 24 consecutive hours or more when required.
• ZEN Connect: This software will allow CLEM correlations to be performed between existing CISR Zeiss light microscopes such as the Zeiss LSM980.

Leica Cryo-Stage and Transfer Equipment:

• Leica VCT500 cryo-SEM system stage for cryo-workflows including cryo-lamella preparation and cryo-SEM
• ACE600 high vacuum electron beam deposition system

Charges:

Location:

• ESB 051