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Electron

JEOL JEM 2100 Plus TEM

JEOL JEM 2100 Plus TEM

Image of JEOL JEM 2100 Plus TEM microscope

Why Use This Microscope?

The JEOL TEM is configured for imaging routine resin embedded samples, high resolution negative stain, 3-D thick sections, large format montaging, and electron tomography.

Configuration:

  • The JEOL JEM 2100 Plus is a modern 200 keV thermionic source transmission electron microscope that is configured for flexibility and ease of use.
  • The TEM supports voltages between 80-200 keV and can switch between these voltages in a matter of minutes without substantial shifts in the image plane.
  • As configured, this microscope makes use of a high-resolution pole piece that has a point-to-point resolution of 2.3 Å and a maximum alpha tilt angle of ±80o when used with a High Tilt Specimen Holder.
  • The microscope features a triple condenser system which permits very good control over the beam conditions allowing Koehler illumination during normal usage, a feature essential for montaging large areas.
  • All lenses are freely programmable and can be recalled as specific settings.
  • The vacuum system uses an ion-getter pump with a turbo molecular pump to achieve vacuum suitable for a LaB6 electron source.
  • The specimen retainer features a double o-ring system to ensure good vacuum during operation of the microscope and less than 15 second return to high vacuum after a specimen insertion.

Cameras:

  • The AMT Nanosprint15L-MarkII
    • Low-noise sCMOS camera
    • 15 megapixel viewing region
    • Sensor size of 5056x2960 rectangle ideal for tomographic reconstructions
    • Frame rates of up to 30 FPS
    • Functions between 20-200 keV
  • The AMT Nanosprint5 CMOS camera from the previous Tecnai T12 resides on sidemount position of the JEOL TEM. This position allows for low magnification field of views to examine the context and locate specific regions of interest without the need to tile or take the microscope into low magnification mode.

Software:

  • SerialEM is an open-source software for tilt series acquisition, large area montaging, CLEM, and automated imaging.
  • The JEOL microscope software allows full control of all microscope parameters without the use of the microscope panels. This permit easy remote usage of the microscope and facilitates remote applications support.

Charges:

$118.00 / hour

Note: To use the microscope you must have an active Account with iLab. Contact Evan, or Rachel, to arrange training.

Location

  • RR1207 MCN